An Optical Diffraction Study of the Stacking Sequences in Silicon Carbide
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Proceedings, annual meeting, Electron Microscopy Society of America
سال: 1976
ISSN: 0424-8201,2690-1315
DOI: 10.1017/s0424820100092426